Espec Highly Accelerated Stress Test (HAST) Chamber


As a consequence of the growth in the electronics and semiconductor industries in recent years, the demand for HAST testing has increased enormously. The HAST (Highly Accelerated Stress Test) is an accelerated form of the THB test. THB is short for Temperature, Humidity and Bias. The HAST accelerates the test process so that it will not take weeks, but only a couple of days. Espec HAST chambers are available in different configurations. The dual chamber model makes it possible to save space and time by carrying out two different tests at the same time. In addition, the HAST systems can be configured with different options. Would you like to know more about the possibilities? Then please feel free to contact us.

Technical specifications

  • Capacity:
    Temperature range:
    Temperature fluctuation:
    Temperature uniformity:
    Humidity range:
    Humidity fluctuation:
    Pressure range:
    Communication interface:
    Product terminals:
    Power supply:
  • 18 (or 2x 18) and 46 (or 2x 46) litre
    +105°C to +142,9°C (+162,2°C)
    ± 0,5°C
    ± 0,5°C at 100%rh (± 0,7°C at 75%rh)
    75 to 100%rh
    ± 3%rh
    0,2 to 4,0 kg/cm² G (0,19 to 3,87 atm)
    Digital program controller
    Standard 12 per chamber, more possible
    Product racks


  • • User friendly controller
    • Save time and space (MD-models)
    • Standard equipped with many safety options
    • Suitable for IEC60068-2-66 standard
    • Reliable system

Some options:

  • • Additional product terminals
    • Digital recorder
    • Custom built racks for circuit boards
    • RS-232C interface


  • • Electronics
    • Semiconductor


  • • HAST tests
    • THB tests